Markov renewal process

In probability and statistics, a Markov renewal process (MRP) is a random process that generalizes the notion of Markov jump processes. Other random processes like Markov chains, Poisson processes, and renewal processes can be derived as special cases of MRPs.

Definition

An illustration of a Markov renewal process

Consider a jump process taking states in a state space Consider the set of random variables , where are the jump times and are the associated states in the sequence of states (see Figure). Let the inter-arrival time . Then the sequence is called a Markov renewal process if:


Relation to other stochastic processes

  1. Let and be as in the definition above. Define a new stochastic process for , then the process is called a semi-Markov process as it happens in a continuous time Markov chain/process (CTMC). The process is Markovian only at the specified jump instants, justifying the name semi-Markov.[1][2][3] (See also: hidden semi-Markov model.)
  2. A semi-Markov process (defined in the above bullet point) in which all the holding times are exponentially distributed is called a CTMC. In other words, if the inter-arrival times are exponentially distributed and if the waiting time in a state and the next state reached are independent, we have a CTMC.
  3. The sequence in the MRP is a discrete-time Markov chain. In other words, if the time variables are ignored in the MRP equation, we end up with a DTMC.
  4. If the sequence of s are independent and identically distributed, and if their distribution does not depend on the state , then the process is a renewal process. So, if the states are ignored and we have a chain of iid times, then we have a renewal process.

See also

References

  1. Medhi, J. (1982). Stochastic processes. New York: Wiley & Sons. ISBN 978-0-470-27000-4.
  2. Ross, Sheldon M. (1999). Stochastic processes (2nd ed.). New York [u.a.]: Routledge. ISBN 978-0-471-12062-9.
  3. Barbu, Vlad Stefan; Limnios, Nikolaos (2008). Semi-Markov chains and hidden semi-Markov models toward applications: their use in reliability and DNA analysis. New York: Springer. ISBN 978-0-387-73171-1.
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