Teodor Gotszalk

Teodor Paweł Gotszalk is a Polish scientist who is head of department of Nanometrology at Wrocław University of Science and Technology. Gotszalk works in the area of nanotechnology, nanometrology particularly scanning probe microscopy (SPM), scanning electron microscopy (SEM) and focused ion beam (FIB techniques), and using microelectromechanical systems (MEMS).

Career

He has been the Head of Department of Nanometrology at the Faculty of Microsystem Electronics and Photonics of Wrocław University of Science and Technology since 2006.[1] Since 2006 he has been chairing the Department of Nanometrology, the first polish team focused on comprehensive metrology of micro- and nanostructures.[2] The studies combine scanning probe microscopy, scanning electron microscopy and focused ion beam (perhaps: SPM, SEM and FIB) techniques together with measurements of electrical, thermal, diffractive and optical properties of the structures.[3]

Grants and awards

Awardee of the German Academic Exchange Service (DAAD) (30 months), Fulbright Program (4 months at the University at Albany College of Nanoscience and Engineering (CNSE) in 2010)[4] and Kosciuszko Foundation (3 months at the University of California, Berkeley, 2022).[5]

References
  1. "Wizytówki pracowników / Wydział Elektroniki, Fotoniki i Mikrosystemów prof. dr hab. inż. Teodor Gotszalk". Politechnika Wrocławska.
  2. "We Wrocławiu otwarto laboratorium do badania nanostruktur za 6,5 mln zł". Computerworld.
  3. "Na Politechnice Wrocławskiej otwarto pracownię badania nanostruktrur". Evertiq.pl (in Polish).
  4. "Teodor Gotszalk". Fulbright Scholar Program.
  5. "Prof. Gotszalk to research nanotubes at Berkeley". Politechnika Wrocławska.
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